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P495 - Spherical grating monochromator (SGM) for soft X-ray radiation at ATHOS beamline at Swiss FEL, Paul Scherrer Institut, Switzerland
P495 - Spherical grating monochromator (SGM) for soft X-ray radiation at ATHOS beamline at Swiss FEL, Paul Scherrer Institut, Switzerland

P495 – SGM FURKA SwissFEL PSI

Application

Spherical grating monochromator (SGM) for soft X-ray radiation

Year of delivery

2022

Installation site

ATHOS beamline at Swiss FEL, Paul Scherrer Institut, Switzerland

This grating unit was developed and built to be integrated into the RIXS system for ATHOS beamline at SwissFEL of Paul Scherrer Institut. The challenge was to accomodate all components for standard functionality and for compensation of spectrometer related spurious movements into a very limited space, without perfomance lost.

Design Features

  • Grating unit for high resolution soft X-ray spectrometer.
  • Spectral range: 200 – 2000 eV.
  • Very compact design for integration into the RIXS system.

  • Optical elements: three spherical gratings.
  • Temperature sensors at internal mechanics.
  • Motorized and encoded vertical translation of the internal mechanics for compensation of spurious height and roll variation upon scattering angle change.
  • Mechanically decoupled internal mechanics from the vacuum chamber.
  • Internal mechanics directly connected to the adjustable support structure underneath.
  • Permanently installed bakeout provisions.

Performance Features

  • High positioning resolution (minimum incremental motion).
  • High pitch rotation stability and repeatability.
  • Minimized mounting induced deformations.

Outer Dimensions

P495 - Outer dimensions - Spherical grating monochromator (SGM) for soft X-ray radiation at ATHOS beamline at Swiss FEL, Paul Scherrer Institut, Switzerland

Technical specifications and performance values

General

Vacuum chamber

Chamber type

rectangular footprint

Main flanges

at the top

Material

1.4404 (C < 0.02%)

Base pressure

10-10 mbar range

Optical design parameters

Beam height (entrance)

1320 mm

Number of gratings

3

Gratings dimensions

290 mm x 50 mm x 50 mm
320 mm x 50 mm x 50 mm
350 mm x 50 mm x 50 mm

Grating mechanics

Pitch rotation

Range

+0.5° to -3.0°

Resolution (design value)

0.001 µrad /motor fine step
(1/128, recommended)
0.0097087 µrad /encoder count

Resolution (measured value)

0.025 µrad

Repeatability

0.07 µrad (pitch)

Long-term stability (> 4h)

0.012 µrad

Translation (grating exchange)

Range

-59.3 mm to 119.6 mm

Resolution (design value)

0.078 µm /motor fine step
(1/128, recommended)
0.005 µm /encoder count

Resolution (measured value)

10 µm

Repeatability

0.14 µrad (pitch)

0.06 µrad (roll)

0.52 µm (lateral position)

Absolute accuracy

< 110 µm

Long-term stability (> 3h)

0.004 µm

Translation (grating height)

Range

-20.82 mm to +6.80 mm
(wedge leveler 1)
-20.96 mm to +7.11 mm
(wedge leveler 2)

Resolution (design value)

0.20 µm /motor step (at actuator)
0.054 µm /motor step
(at wedge leveler)
0.05 µm /encoder count

Resolution (measured value)

5 µm (vertical translation)

Repeatability

0.13 µm (pitch)
0.12 µm (roll)
< 1 µm (height)

Absolute accuracy

< 20 µm

Long-term stability (> 3h)

< 0.02 µm

Roll rotation

Range

± 15 mrad

Resolution (design value)

0.20 µm /motor step (at actuator)
0.054 µm /motor step
(at wedge leveler)
0.05 µm /encoder count

Resolution (measured value)

5 µrad (roll)

Repeatability

0.20 µm (pitch)
0.22 µm (roll)
0.45 µm (vertical position)

Parasitic height after
roll rotation

0.46 µm

Entrance flange mask

Translation

Range

-46.63 mm to +46.62 mm

Resolution (design)

0.039 µm /motor fine step
(1/128, recommended)
0.05 µm /encoder count

Performance Test Results

Pitch deviation after pitch change
P495 - Pitch deviation after pitch variation - Resonant inelastic X-ray scattering (RIXS) spectrometer at ATHOS beamline at Swiss FEL, Paul Scherrer Institut, Switzerland
Grating pitch long-term stability
P495 - Grating pitch stability - Resonant inelastic X-ray scattering (RIXS) spectrometer at ATHOS beamline at Swiss FEL, Paul Scherrer Institut, Switzerland
Pitch deviation after roll change
P495 - Pitch deviation after roll variation - Resonant inelastic X-ray scattering (RIXS) spectrometer at ATHOS beamline at Swiss FEL, Paul Scherrer Institut, Switzerland
Roll deviation after roll change
P495 - Roll deviation after roll variation - Resonant inelastic X-ray scattering (RIXS) spectrometer at ATHOS beamline at Swiss FEL, Paul Scherrer Institut, Switzerland
Pitch deviation after grating lateral translation
Roll deviation after grating lateral translation
Pitch deviation after grating vertical translation
P495 - Pitch deviation after height variation - Resonant inelastic X-ray scattering (RIXS) spectrometer at ATHOS beamline at Swiss FEL, Paul Scherrer Institut, Switzerland
Roll deviation after grating vertical translation
Vertical deviation after grating vertical translation
P495 - Heightdeviation after heigh variation - Resonant inelastic X-ray scattering (RIXS) spectrometer at ATHOS beamline at Swiss FEL, Paul Scherrer Institut, Switzerland
Vertical deviation after roll variation
P495 - Height deviation after roll variation - Resonant inelastic X-ray scattering (RIXS) spectrometer at ATHOS beamline at Swiss FEL, Paul Scherrer Institut, Switzerland
Lateral deviation after grating lateral translation
P495 - Lateral position deviation after grating translation - Resonant inelastic X-ray scattering (RIXS) spectrometer at ATHOS beamline at Swiss FEL, Paul Scherrer Institut, Switzerland
Absolute accuracy of grating lateral translation
Grating pitch positioning resolution
P495 - Grating pitch positioning - Resonant inelastic X-ray scattering (RIXS) spectrometer at ATHOS beamline at Swiss FEL, Paul Scherrer Institut, Switzerland
Grating pitch step width
P495 - Grating pitch step width - Resonant inelastic X-ray scattering (RIXS) spectrometer at ATHOS beamline at Swiss FEL, Paul Scherrer Institut, Switzerland
Grating roll positioning resolution
P495 - Grating roll positioning - Resonant inelastic X-ray scattering (RIXS) spectrometer at ATHOS beamline at Swiss FEL, Paul Scherrer Institut, Switzerland
Grating roll step width
P495 - Grating roll step width - Resonant inelastic X-ray scattering (RIXS) spectrometer at ATHOS beamline at Swiss FEL, Paul Scherrer Institut, Switzerland
Grating lateral translation positioning resolution
Grating lateral translation step width
Grating vertical translation positioning resolution
P495 - Grating height positioning - Resonant inelastic X-ray scattering (RIXS) spectrometer at ATHOS beamline at Swiss FEL, Paul Scherrer Institut, Switzerland
Grating vertical translation step width
Grating lateral position long-term stability
P495 - Grating lateral position stability - Resonant inelastic X-ray scattering (RIXS) spectrometer at ATHOS beamline at Swiss FEL, Paul Scherrer Institut, Switzerland
Residual gas analysis
P495 - Residual gas analysis - Resonant inelastic X-ray scattering (RIXS) spectrometer at ATHOS beamline at Swiss FEL, Paul Scherrer Institut, Switzerland
Grating vertical position long-term stability
P495 - Grating vertical position stability - Resonant inelastic X-ray scattering (RIXS) spectrometer at ATHOS beamline at Swiss FEL, Paul Scherrer Institut, Switzerland