P442 – SIX RIXS-Spectrometer NSLS-II
Application
Resonant inelastic X-ray scattering (RIXS) spectrometer
Year of delivery
2017
Installation site
SIX beamline at synchrotron radiation source NSLS-II, USA
Design Features
- Spectral range: 150 – 2000 eV.
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Variable included angle monochromator design with pre-mirror.
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The collimating mirror unit, the grating unit and the detector unit have separate rotational guidance for scattering angle variation.
Performance Features
- Very high energy resolution over the whole spectral range.
- Very high vibrational and drift stability.
Outer Dimensions
Technical specifications and performance values
General
Spectrometer rotation
Range
120°
Resolution
< 0.01°
Circle of confusion
< 9 µm (at R = 3 m)
< 115 µm (at R = 15 m)
Vertical deviation
< 7 µm (at R = 3 m)
< 40 µm (at R = 15 m)
Mirror and grating mechanics
Pitch rotation
Range
> 20°
Resolution
< 0.01 µm
Repeatability
≤ 0.15 µrad
Stability
< 0.05 µrad
Performance Test Results
Pitch deviation after pitch change (grating)
Roll deviation after pitch change (grating)
Pitch deviation after grating translation
Roll deviation after grating translation
Mirror pitch long-term stability
Grating pitch long-term stability
Parasitic height deviation upon
grating unit rotation
Parasitic height deviation upon
detector unit rotation
Circle of confusion (grating unit rotation)
Circle of confusion (detector unit rotation)
